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ArticleJ-GLOBAL ID:200902165070138213整理番号:02A0888276

Reliability Problems of Passive Optical Devices and Modules after Mechanical, Thermal and Humidity Testing.

機械的,熱的と湿度的試験後の受動光デバイスとモジュールの信頼性問題

著者:DUERR K(Alcatel SEL AG, Stuttgart, DEU)、PUSCH R(Alcatel SEL AG, Stuttgart, DEU)、SCHMITT G(Alcatel SEL AG, Stuttgart, DEU)
資料名:Microelectron Reliab 巻:42 号:9/11 ページ:1329-1332
発行年:2002年09月
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About J-GLOBAL

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