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J-GLOBAL ID:200902165099680610   Reference number:99A0773960

On the grain size and coalescence stress resulting from nucleation and growth processes during formation of polycrystalline thin films.

多結晶薄膜形成中の核形成と成長過程から生じる結晶粒サイズと合体応力について
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Material:
Volume: 14  Issue:Page: 3164-3168  Publication year: Jul. 1999 
JST Material Number: D0987B  ISSN: 0884-2914  CODEN: JMREEE  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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Thin films in general 

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