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ArticleJ-GLOBAL ID:200902165112394231整理番号:95A0893227

Reconstructed Si(111) Surface Obtained by Electron Beam Heating Using a Conventional Transmission Electron Microscope.

通常の透過型電子顕微鏡を用いた電子ビーム加熱によって得られたSi(111)表面の再構成

著者:TOMITA M(NIT Interdisciplinary Res. Lab., Tokyo, JPN)
資料名:Jpn J Appl Phys Part 2 巻:34 号:9B ページ:L1224-L1226
発行年:1995年09月15日
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