Art
J-GLOBAL ID：200902165121591414   Reference number：93A0913287

High Resolution electron microscopy of nano-material interfaces.

ナノ材料界面の高分解能電子顕微鏡観察
Author (2)：
ISHIDA Y

About ISHIDA Y

(Univ. Tokyo)

About Univ. Tokyo

, 
ICHINOSE H

About ICHINOSE H

(Univ. Tokyo)

About Univ. Tokyo


Material：
東京大学工学部総合試験所年報  (Annual Report of the Engineering Research Institute, Faculty of Engineering, University of Tokyo)

About 東京大学工学部総合試験所年報


Volume： 52  Page： 115-119  Publication year： Sep. 1993 
JST Material Number： F0464A  ISSN： 0371-3067  Document type： Article
Article type： 文献レビュー  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
Thesaurus term：
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All keywords is available on JDreamIII(charged).
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palladium

About palladium

,...
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Lattice defects in general 
(BK12010J)

About Lattice defects in general

,  Surface structure of solids in general 
(BK15010E)

About Surface structure of solids in general

,  Microscopy determination of structures 
(BK01040E)

About Microscopy determination of structures

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
ナノ材料

About ナノ材料

, 
界面

About 界面

, 
高分解能電子顕微鏡観察

About 高分解能電子顕微鏡観察


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