Investigation of high speed deformed Ni/Cu layers using Auger electron spectroscopy.

LEE J-W; NAKAMURA M; UNE T; TANAKA T; KOMATSU M; KIRITANI M

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J-GLOBAL ID：200902165148179973 Reference number：03A0221480

Investigation of high speed deformed Ni/Cu layers using Auger electron spectroscopy.

‘オージェ電子分光’法を使った高速変形Ni/Cu多層構造の調査

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Author (6)： , , , , ,
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Page： 803-807 Publication year： 2002
JST Material Number： N20030303 Document type： Article
Article type：短報 Country of issue： Japan (JPN) Language： ENGLISH (EN)

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Metallic materials , Metallic thin films

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