Art
J-GLOBAL ID:200902165154163493   Reference number:02A0446085

Regularity of Ga+ Primary Ion TOF-SIMS Fragment Pattern of Inorganic Compounds.

無機化合物におけるGa+1次イオンTOF-SIMSフラグメント・パターンの規則性
Author (2):
Material:
Volume: 23  Issue:Page: 306-320  Publication year: May. 10, 2002 
JST Material Number: F0940B  ISSN: 0388-5321  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=02A0446085&from=J-GLOBAL&jstjournalNo=F0940B") }}
JST classification (2):
JST classification
Category name(code) classified by JST.
Mass spectrometry  ,  Physical analysis of inorganic compounds 
Reference (31):
more...
Terms in the title (5):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page