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ArticleJ-GLOBAL ID:200902165156821307整理番号:96A0707539

Multilayer EUV/x-ray polychromators for plasma diagnostics.

プラズマ診断のための多層鏡EUV/X線ポリクロメータ

著者:SHMAENOK L A(FOM‐Inst. Plasma Physics, Nieuwegein, NLD)、PLATONOV YU YA(Inst. Physics of Microstructures, Nizhny Novgorod, SUN)、SALASHCHENKO N N(Inst. Physics of Microstructures, Nizhny Novgorod, SUN)・・・
資料名:J Electron Spectrosc Relat Phenom 巻:80 ページ:259-262
発行年:1996年05月
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