FALP studies of the dissociative recombination coefficients for O+2 and NO+ within the electron temperature range 300-2000K.

SPANEL P; DITTRICHOVA L; SMITH D

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J-GLOBAL ID：200902165191175272 Reference number：94A0070901

FALP studies of the dissociative recombination coefficients for O⁺₂ and NO⁺ within the electron temperature range 300-2000K.

電子温度範囲300-2000KでのO₂⁺とNO⁺に対する解離的再結合定数のFALP研究

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Author (3)： , ,
Material：
Volume： 129 Page： 183-191 Publication year： Nov. 30, 1993
JST Material Number： D0625A ISSN： 0168-1176 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Reaction due to charged particle bombardment and electric discharge

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