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ArticleJ-GLOBAL ID:200902165204645737整理番号:97A0510302

Signal to noise ratio comparison of SAL versus dual-stripe magnetoresistive heads under comparable reliability conditions.

比較可能な信頼性条件の下でのSAL対デュアルストライプ磁気抵抗ヘッドの信号対雑音比の比較

著者:GEORGE P K(St. Cloud State Univ., Minnesota)、ZHU J‐G(Univ. Minnesota, Minnesota)
資料名:J Appl Phys 巻:81 号:8, Pt.2B ページ:4900-4902
発行年:1997年04月15日
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