Synchrotron x-ray microdiffraction diagnostics of multilayer optoelectronic devices.

CAI Z-H; RODRIGUES W; ILINSKI P; LEGNINI D; LAI B; YUN W; ISAACS E D; LUTTERODT K E; KETELSEN L J P

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J-GLOBAL ID：200902165214317193 Reference number：99A0706082

Synchrotron x-ray microdiffraction diagnostics of multilayer optoelectronic devices.

多層オプトエレクトロニクス素子のシンクロトロンx線微小回折による診断

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Material：
Volume： 75 Issue： 1 Page： 100-102 Publication year： Jul. 05, 1999
JST Material Number： H0613A ISSN： 0003-6951 CODEN： APPLAB Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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Semiconductor thin films , General

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