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ArticleJ-GLOBAL ID:200902212374036997整理番号:06A0578329

Embedded Charge Investigation: Industry Concerns and Metrology Solutions

埋め込み電荷の研究:工業的な関心事と測定法

著者:SOLECKY Eric(IBM Systems and Technol. Group, NY)、VAKAS Georgios(IBM Systems and Technol. Group, NY)、ARCHIE Chas(IBM Systems and Technol. Group, NY)・・・
資料名:Proc SPIE 巻:6152 号:Pt.1 ページ:615203.1-615203.9
発行年:2006年
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.