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ArticleJ-GLOBAL ID:200902212375752114整理番号:06A0311160

TENSILE TEST APPARATUS FOR MICRO-SCALE SPECIMENS ON SCANNING ELECTRON MICROSCOPE USING SUB-PIXEL DIGITAL IMAGE CORRELATION

サブピクセル画像相関の適用による走査電子顕微鏡におけるマイクロスケール試験片用引張試験装置

著者:PRADHAN Sailesh(Southern Illinois Univ., Illinois)、CHU T. C.(Southern Illinois Univ., Illinois)
資料名:ASME DSC (Am Soc Mech Eng Dyn Syst Control) 巻:74-2 ページ:1769-1772
発行年:2005年
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.