Art
J-GLOBAL ID：200902212375752114   Reference number：06A0311160

TENSILE TEST APPARATUS FOR MICRO-SCALE SPECIMENS ON SCANNING ELECTRON MICROSCOPE USING SUB-PIXEL DIGITAL IMAGE CORRELATION

サブピクセル画像相関の適用による走査電子顕微鏡におけるマイクロスケール試験片用引張試験装置
Author (2)：
PRADHAN Sailesh

About PRADHAN Sailesh

(Southern Illinois Univ., Illinois)

About Southern Illinois Univ., Illinois

, 
CHU T. C.

About CHU T. C.

(Southern Illinois Univ., Illinois)

About Southern Illinois Univ., Illinois


Material：
ASME. DSC (American Society of Mechanical Engineers. Dynamic Systems and Control)  (ASME DSC (Am Soc Mech Eng Dyn Syst Control))

About ASME. DSC (American Society of Mechanical Engineers. Dynamic Systems and Control)


Volume： 74-2  Page： 1769-1772  Publication year： 2005 
JST Material Number： D0832B  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
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*scanning electron microscope

About scanning electron microscope

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Material testing 
(HB02020U)

About Material testing

,  Microscopy determination of structures 
(BK01040E)

About Microscopy determination of structures

Terms in the title (6)：
Terms in the title
Keywords automatically extracted from the title.
サブピクセル

About サブピクセル

, 
画像相関

About 画像相関

, 
走査電子顕微鏡

About 走査電子顕微鏡

, 
マイクロスケール

About マイクロスケール

, 
試験片

About 試験片

, 
引張試験装置

About 引張試験装置


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