Art
J-GLOBAL ID：200902212392707637
Reference number：03A0255041
Characterization of defect type and dislocation density in double oxide heteroepitaxial CeO2/YSZ/Si(001) films
二重酸化物ヘテロエピタキシャルCeO2/YSZ/Si(001)膜における欠陥のタイプと転位密度の評価
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Author (6)：
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Material：
Volume：
76
Issue：
6
Page：
969-973
Publication year：
Apr. 2003
JST Material Number：
D0256C
ISSN：
0947-8396
CODEN：
APHYCC
Document type：
Article
Article type：
原著論文
Country of issue：
Germany, Federal Republic of (DEU)
Language：
ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
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Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
JST classification (2)：
JST classification
Category name(code) classified by JST.
Oxide thin films
, Lattice defects in other inorganic compounds
Terms in the title (7)：
Terms in the title
Keywords automatically extracted from the title.
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