About J-GLOBAL

日本語

Font size
  • A
  • A

Articleの詳細情報

ArticleJ-GLOBAL ID:200902212406964506整理番号:05A0752925

Electrical characterization of NiSi/Si interfaces formed by a single and a two-step rapid thermal silicidation

1段階および2段階の急速熱ケイ化プロセスによって形成したNiSi/Si界面の電気的特性評価

著者:JIANG Yu‐Long(Fudan Univ., Shanghai, CHN)、RU Guo‐Ping(Fudan Univ., Shanghai, CHN)、HUANG Wei(Fudan Univ., Shanghai, CHN)・・・
資料名:Semicond Sci Technol 巻:20 号:8 ページ:716-719
発行年:2005年08月
  • J-GLOBAL home
  • Bookmark J-GLOBAL

J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.