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ArticleJ-GLOBAL ID:200902212418076444整理番号:06A0674421

Resistivity scaling in single-walled carbon nanotube films patterned to submicron dimensions

サブミクロンサイズにパターン形成した単層カーボンナノチューブでの電気抵抗率スケーリング

著者:BEHNAM Ashkan(Dep. of Electrical and Computer Engineering, Univ. of Florida, Gainesville, Florida 32611)、NORIEGA Leila(Dep. of Electrical and Computer Engineering, Univ. of Florida, Gainesville, Florida 32611)、CHOI Yongho(Dep. of Electrical and Computer Engineering, Univ. of Florida, Gainesville, Florida 32611)・・・
資料名:Appl Phys Lett 巻:89 号:9 ページ:093107-093107-3
発行年:2006年08月28日
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About J-GLOBAL

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