About J-GLOBAL

日本語

Font size
  • A
  • A

Articleの詳細情報

ArticleJ-GLOBAL ID:200902212418622619整理番号:04A0918435

Characterization Complex Voltage Contrast Image Using Atomic Force Microscopy

原子間力顕微鏡検査法を用いる特性化複合電圧コントラスト

著者:CHEN C H(Taiwan Semiconductor Manufacturing Co., Hsin‐Chu, TWN)、SHEN C M(Taiwan Semiconductor Manufacturing Co., Hsin‐Chu, TWN)、HUANG C M(Taiwan Semiconductor Manufacturing Co., Hsin‐Chu, TWN)・・・
資料名:Proc Int Symp Test Fail Anal 巻:30th ページ:487-490
発行年:2004年
  • J-GLOBAL home
  • Bookmark J-GLOBAL

J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.