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J-GLOBAL ID:200902212451616624   Reference number:08A0396499

Superposition Effect Validation of Inductive Coupling Noise Based on Measurement of Interconnect Delay Variation

バス配線における誘導性クロストークノイズによる遅延変動の実測とノイズ重ね合わせ効果の検証
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Material:
Volume: 107  Issue: 510(ICD2007 167-178)  Page: 55-60  Publication year: Feb. 28, 2008 
JST Material Number: S0532B  ISSN: 0913-5685  Document type: Proceedings
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
Reference (20):
  • MASSOUD, Y. Modeling and analysis of differential signaling for minimizing inductive crosstalk. Proc. IEEE/ACM DAC, June 2001. 2001, 804-809
  • SEONGKYUN, S. Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. IEEE Trans. VLSI Syst. 2004, 12, 4, 395-407
  • DEUTSCH, A. On-chip wiring design challenges for gigahertz operation. Proc. of the IEEE. 2001, 89, 4, 529-555
  • CHAN, S. C. Practical considerations in RLCK crosstalk analysis for digital integrated circuits. Proc. IEEE/ACM ICCAD, Nov. 2001. 2001, 598-604
  • ELZINGA, M. An Active 90nm Inducitive Signal Noise Testchip with Realistic Microprocessor Signal Buses. Proc. IEEE ICICDT, May 2006. 2006
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