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ArticleJ-GLOBAL ID:200902212457675908整理番号:04A0220470

Phase Noise Metrology and Modelling of Microwave Transistors Applications to the design of state of the art Dielectric Resonator Oscillators

現状の誘電体共振器発振器の設計に対するマイクロ波トランジスタの使用の位相雑音測定とモデル化

著者:LLOPIS O(LAAS, CNRS, Toulouse, FRA)、CIBIEL G(LAAS, CNRS, Toulouse, FRA)
資料名:Proc SPIE 巻:5113 ページ:179-191
発行年:2003年
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About J-GLOBAL

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