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J-GLOBAL ID:200902212472608265   Reference number:06A0568979

Degradation Behavior of Avalanche Photodiodes With a Mesa Structure Observed Using a Digital OBIC Monitor

ディジタルOBICモニタを用いて観測したメサ構造のアバランシェフォトダイオードの劣化挙動
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Material:
Volume: 53  Issue:Page: 1567-1574  Publication year: Jul. 2006 
JST Material Number: C0222A  ISSN: 0018-9383  CODEN: IETDAI  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices  ,  Photodetectors 

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