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ArticleJ-GLOBAL ID:200902212472608265整理番号:06A0568979

Degradation Behavior of Avalanche Photodiodes With a Mesa Structure Observed Using a Digital OBIC Monitor

ディジタルOBICモニタを用いて観測したメサ構造のアバランシェフォトダイオードの劣化挙動

著者:TAKESHITA Tatsuya(NTT Corp., Kanagawa, JPN)、HIROTA Yukihiro(NTT Corp., Kanagawa, JPN)、ISHIBASHI Tadao(NTT Electronics Corp., Kanagawa, JPN)・・・
資料名:IEEE Trans Electron Devices 巻:53 号:7 ページ:1567-1574
発行年:2006年07月
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About J-GLOBAL

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