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ArticleJ-GLOBAL ID:200902212478803841整理番号:08A0717700

放射光微小角入射小角・広角X線散乱測定による溶媒蒸発結晶化過程における高分子薄膜の高次構造評価

著者:佐々木園(JASRI/SPring‐8)、佐々木園(理研 播磨研/SPring‐8)、増永啓康(JASRI/SPring‐8)・・・
資料名:高分子学会予稿集(CD-ROM) 巻:57 号:1 Disk1 ページ:2PF058
発行年:2008年05月08日
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.