About J-GLOBAL

日本語

Font size
  • A
  • A

Articleの詳細情報

ArticleJ-GLOBAL ID:200902076457008480整理番号:91A0063523

Measuring surface roughness of an optical thin film with scanning tunneling microscopes.

走査型トンネル顕微鏡による光学薄膜の表面粗さ測定

著者:HABIB K(Kuwait Inst. Scientific Research, Safat, KWT)、ELING V(Digital Instruments, Inc., California, USA)、WU C(Digital Instruments, Inc., California, USA)
資料名:J Mater Sci Lett 巻:9 号:10 ページ:1194
発行年:1990年10月
  • J-GLOBAL home
  • Bookmark J-GLOBAL

J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.