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J-GLOBAL ID:200902076499588320   Reference number:85A0046896

Electron tunneling and the emission of secondary ions from silicon surfaces.

シリコンの表面からの電子のトンネル効果と二次イオンの放出
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Page: 60-62  Publication year: 1984 
JST Material Number: K19840471  ISBN: 0-387-13316-X  Document type: Proceedings
Article type: 原著論文  Country of issue: Germany, Federal Republic of (DEU)  Language: ENGLISH (EN)
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Ion emission 
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