Art
J-GLOBAL ID：200902076563442687
Reference number：90A0493571
AES depth profile studies of interdiffusion in the Ag-Cu bilayer and multilayer thin films.
Ag-Cu2層および多層薄膜における相互拡散のAuger電子分光の深さ分布による研究
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Author (1)：
Material：
Volume：
118
Issue：
1
Page：
99-107
Publication year：
Mar. 1990
JST Material Number：
D0774A
ISSN：
0031-8965
Document type：
Article
Article type：
原著論文
Country of issue：
Germany, Federal Republic of (DEU)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Diffusion in metals
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