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ArticleJ-GLOBAL ID:200902076614046005整理番号:86A0366943

Effect of yield stress and grain size on threshold and fatigue limit.

疲れ限度としきい値に対する降伏応力と粒径の影響

著者:MUTOH Y(Technological Univ. Nagaoka)、RADHAKRISHNAN V M(I.I.T., India)
資料名:Trans ASME J Eng Mater Technol 巻:108 号:2 ページ:174-178
発行年:1986年04月
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About J-GLOBAL

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