J-GLOBAL ID：200902076614046005整理番号：86A0366943
Effect of yield stress and grain size on threshold and fatigue limit.
疲れ限度としきい値に対する降伏応力と粒径の影響
著者：MUTOH Y(Technological Univ. Nagaoka)、RADHAKRISHNAN V M(I.I.T., India)
資料名：Trans ASME J Eng Mater Technol 巻：108 号：2 ページ：174-178
発行年：1986年04月
資料名：Trans ASME J Eng Mater Technol 巻：108 号：2 ページ：174-178
発行年：1986年04月
J-GLOBAL ID: 200902076614046005
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