Art
J-GLOBAL ID：200902076663215505   Reference number：85A0048756

Reliability of high speed CMOS logic in the plastic DIL package.

プラスチックDILパッケージの高速CMOSロジックの信頼性
Author (2)：
GOTTESFELD S

About GOTTESFELD S

(RCA, New Jersey)

About RCA, New Jersey

, 
GIBBONS L

About GIBBONS L

(RCA, New Jersey)

About RCA, New Jersey


Material：
Electronic Engineering  (Electron Eng)

About Electronic Engineering


Volume： 56  Issue： 694  Page： 107-110,113-114  Publication year： Oct. 1984 
JST Material Number： B0452A  ISSN： 0013-4902  CODEN： ELCEA  Document type： Article
Article type： 解説  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
reliability(property)

About reliability(property)

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=85A0048756&from=J-GLOBAL&jstjournalNo=B0452A") }}
JST classification (2)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

,  Logic circuits 
(NC05070B)

About Logic circuits

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
プラスチック

About プラスチック

, 
パッケージ

About パッケージ

, 
CMOS

About CMOS

, 
ロジック

About ロジック


Return to Previous Page

TOP

BOTTOM