Art
J-GLOBAL ID:200902174363178855   Reference number:95A0401952

Development and Characterization of a New Slanted-Grid-Type Ion Energy Analyzer and Its Application to Plasma Diagnostics in Open End System.

新斜入射タイプイオン計測器の製作・較正と開放端磁場端損失プラズマの計測
Author (8):
Material:
Volume: 12th  Page: 291  Publication year: Mar. 1995 
JST Material Number: Y0877A  Document type: Proceedings
Country of issue: Japan (JPN)  Language: JAPANESE (JA)

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