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J-GLOBAL ID：201602244056061329   Reference number：16A0769981

Workload-aware worst path analysis of processor-scale NBTI degradation

プロセッサスケールNBTI劣化の作業負荷を意識した最悪のパス解析【Powered by NICT】

Author (6)： Bian Song (Department of Communications and Computer Engineering, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto 606-8501, Japan) ,  Shintani Michihiro (Department of Communications and Computer Engineering, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto 606-8501, Japan) ,  Morita Shumpei (Department of Communications and Computer Engineering, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto 606-8501, Japan) ,  Awano Hiromitsu (Department of Communications and Computer Engineering, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto 606-8501, Japan) ,  Hiromoto Masayuki (Department of Communications and Computer Engineering, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto 606-8501, Japan) ,  Sato Takashi (Department of Communications and Computer Engineering, Kyoto University, Yoshida-hon-machi, Sakyo, Kyoto 606-8501, Japan)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2016  Issue： GLSVLSI  Page： 203-208  Publication year： 2016 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： As technology further scales s...

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Thesaurus term： *arithmetic processor ,  invariance ,  clinical pathway ,  semiconductor device ,  algorithm ,  reliability(property)
Semi thesaurus term： 数値実験 ,  決定論 ,  回路構成 ,  負荷依存性 ,  *パス解析 ,  *NBTI , 【Automatic Indexing@JST】

JST classification (2)： Pattern recognition  (JE07000S) ,  Signal theory  (ND02020G)

Terms in the title (6)： プロセッサ ,  スケール ,  NBTI ,  作業負荷 ,  意識 ,  パス解析