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J-GLOBAL ID：201702221190440625   Reference number：17A0055453

Highly reliable long-term operation of AlGaN/GaN/AlN HFETs grown on silver substrate

銀基板上に成長させたAlGaN/GaN/AlN FETの高信頼性長期運転【Powered by NICT】

Author (10)： Fox A. (Peter Gruenberg Institute (PGI-9), Forschungszentrum Juelich, 52425 Juelich, Germany) ,  Mikulics M. (Peter Gruenberg Institute (PGI-9), Forschungszentrum Juelich, 52425 Juelich, Germany) ,  Marso M. (Faculte ́ des Sciences, de la Technologie et de la Communication, Universite ́ du Luxembourg, L-1359 Luxembourg) ,  Kocan M. (School of Electrical, Electronic and Computer Engineering, University of Western Australia, Crawley, WA, Australia) ,  Sofer Z. (Dept. of Inorganic Chemistry, Institute of Chemical Technology, Prague, Technicka ́ 5, 166 28 Prague 6, Czech Republic) ,  Kordos P. (Institute of Electronics and Photonics, Slovak Technical University, SK-81219 Bratislava, Slovak Republic) ,  Luth H. (Peter Gruenberg Institute (PGI-9), Forschungszentrum Juelich, 52425 Juelich, Germany) ,  Schubert J. (Peter Gruenberg Institute (PGI-9), Forschungszentrum Juelich, 52425 Juelich, Germany) ,  Grutzmacher D. (Peter Gruenberg Institute (PGI-9), Forschungszentrum Juelich, 52425 Juelich, Germany) ,  Hardtdegen H. (Peter Gruenberg Institute (PGI-9), Forschungszentrum Juelich, 52425 Juelich, Germany)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2016  Issue： ASDAM  Page： 65-68  Publication year： 2016 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： We developed a novel ”combined...

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Thesaurus term： channel ,  epitaxy ,  electrical property ,  *aluminum nitride ,  nitride ,  optimization
Semi thesaurus term： 長期安定性 ,  ドレイン電流 ,  サファイア基板 ,  熱散逸 ,  運転特性 ,  ヘテロ構造 ,  *AlGaN/GaN ,  金属基板 ,  *高信頼性 , 【Automatic Indexing@JST】

JST classification (3)： Transistors  (NC03070N) ,  Semiconductor-semiconductor contacts with Gr.13-15 element compounds  (BM03082Y) ,  Semiconductor thin films  (BK14040E)

Terms in the title (8)： 銀 ,  成長 ,  AlGaN ,  GaN ,  AlN ,  FET ,  高信頼性 ,  長期