Art

J-GLOBAL ID：201702239103120705   Reference number：17A0173196

Study and Fabrication Broad Spectral Absorbing Film in Second-order Correlated Imaging System

二次相関イメージングシステムにおけるスペクトル吸収スペクトルの低減について述べた。【JST・京大機械翻訳】

Author (5)： Fu Xiuhua (Department of Optics and Electric Engineering, Changchun University of Science and Technology) ,  Xiong Shifu (Department of Optics and Electric Engineering, Changchun University of Science and Technology) ,  Liu Dongmei (Department of Optics and Electric Engineering, Changchun University of Science and Technology) ,  Zhang Jing (Department of Optics and Electric Engineering, Changchun University of Science and Technology) ,  Cheng Huiting (Department of Optics and Electric Engineering, Changchun University of Science and Technology)
Material： Guangzi Xuebao  (Acta Photonica Sinica)
Volume： 45  Issue： 10  Page： 1031001-1-1031001-6  Publication year： 2016 
JST Material Number： W1500A  ISSN： 1004-4213  CODEN： GUXUED  Document type： Article
Article type： 原著論文  Country of issue： China (CHN)  Language： CHINESE (ZH)

Abstract/Point： According to the demand for in...

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Thesaurus term： vacuum deposition ,  thin film ,  absorption coefficient ,  annealing (heat treatment) ,  *spectrum ,  process parameter ,  internal stress ,  *absorption spectrum ,  optimization ,  wide band ,  *second phase ,  coating material (cover) ,  film thickness ,  *imaging system ,  modification
Semi thesaurus term： 逆解析 , 【Automatic Indexing@JST】

Author keywords (6)： Thin film ,  Correlated imaging ,  Stepped vacuum annealing ,  Reverse inversion ,  Internal stress ,  Absorbing film

JST classification (2)： Oxide thin films  (BK14050P) ,  Manufacturing technology of solid-state devices  (NC03030V)

Terms in the title (4)： 相関 ,  イメージングシステム ,  スペクトル ,  吸収スペクトル