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J-GLOBAL ID:201702252835132365   Reference number:17A0495234

Study on the band engineering of epitaxial silicene through the fusion of experimental and calculation researches

実験と計算の融合によるエピタキシャルシリセンのバンドエンジニアリング研究
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Material:
Volume: 2015  Page: ROMBUNNO.51 (WEB ONLY)  Publication year: 2015 
JST Material Number: U0002A  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Semiconductor thin films  ,  Electronic structure of crystalline semiconductors 
Reference (12):
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  • W.-F. Tsai, C.-Y. Huang, T.-R. Chang, H. Lin, H.-T. Jeng, and A. Bensil, 2013, Nat. Commun., 4: 1500-1505.
  • P. De Padova, B. Perfetti, C. Olivieri, C. Quaresima, C. Ottaviani, and G. Le Lay, 2012, J. Phys.: Condens. Matter, 24: 223001-223010.
  • P. Vogt, P. De Padova, C. Quaresima, J. Avila, E. Frantzeskakis, M. C. Asensio, A. Resta, B. Ealet, and G. Le Lay, 2012, Phys. Rev. Lett., 108(15): 155501-155505.
  • T. Aizawa, S. Suehara, and S. Otani, 2014, J. Phys. Chem. C, 118: 23049-23057.
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