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J-GLOBAL ID：201702265103033101   Reference number：17A0214370

Contact resistivities in gamma-valley materials

ガンマ谷材料における接触抵抗率【Powered by NICT】
Author (1)：
Solomon P. M.

About Solomon P. M.

(IBM, T.J. Watson Research. Center, Yorktown Heights, NY, USA)

About IBM, T.J. Watson Research. Center, Yorktown Heights, NY, USA


Material：
IEEE Conference Proceedings  (IEEE Conf Proc)

About IEEE Conference Proceedings


Volume： 2016  Issue： IEDM  Page： 36.6.1-36.6.4  Publication year： 2016 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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A model for contact resistivit...
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Thesaurus term：
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screening(inspection)

About screening(inspection)

, 
symmetry

About symmetry

, 
electric current

About electric current

, 
semiconductor

About semiconductor

, 
*contact resistance

About contact resistance

, 
Schottky barrier

About Schottky barrier


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
ITRS

About ITRS

, 
障壁高さ

About 障壁高さ

, 
*比接触抵抗

About 比接触抵抗

, 【Automatic Indexing@JST】
JST classification (1)：
JST classification
Category name(code) classified by JST.
Semiconductor-metal contacts 
(BM03084G)

About Semiconductor-metal contacts

Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
谷

About 谷

, 
接触抵抗率

About 接触抵抗率


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