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J-GLOBAL ID:201602230166078618   Reference number:16A1286318

Measurement of voids in a-Si:H film and their influence on silicon heterojunction solar cell

a-Si中のボイドの測定::H膜とその影響シリコンヘテロ接合太陽電池【Powered by NICT】
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Volume: 2016  Issue: PVSC  Page: 3072-3073  Publication year: 2016 
JST Material Number: W2441A  Document type: Proceedings
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Diameter (D) and number densit...
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Pattern recognition  ,  AD/DA conversion circuits  ,  Natural language processing  ,  Signal theory 
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