Art

J-GLOBAL ID：201602238980101609   Reference number：16A0072890

Beam transverse size and emittance measurement of HLS II using interferometry

干渉法によるHLS IIのビーム横方向サイズとエミッタンス測定【Powered by NICT】

Author (8)： Tang Kai (National Synchrotron Radiation Lab., Univ. of Sci. and Technol. of China, Hefei) ,  Wang Jigang (National Synchrotron Radiation Lab., Univ. of Sci. and Technol. of China, Hefei) ,  Sun Baogen (National Synchrotron Radiation Lab., Univ. of Sci. and Technol. of China, Hefei) ,  Tang Leilei (National Synchrotron Radiation Lab., Univ. of Sci. and Technol. of China, Hefei) ,  Lu Ping (National Synchrotron Radiation Lab., Univ. of Sci. and Technol. of China, Hefei) ,  Yang Yongliang (National Synchrotron Radiation Lab., Univ. of Sci. and Technol. of China, Hefei) ,  Cheng Chaocai (National Synchrotron Radiation Lab., Univ. of Sci. and Technol. of China, Hefei) ,  Li Hao (National Synchrotron Radiation Lab., Univ. of Sci. and Technol. of China, Hefei)
Material： Qiangjiguang yu Lizishu  (High Power Laser and Particle Beams)
Volume： 27  Issue： 7  Page： 075101-1-075101-5  Publication year： 2015 
JST Material Number： C2482A  ISSN： 1001-4322  CODEN： QYLIEL  Document type： Article
Article type： 原著論文  Country of issue： China (CHN)  Language： CHINESE (ZH)

Abstract/Point： With the purpose of measuring ...

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Thesaurus term： *interferometry ,  multiplex ,  visible light ,  measurement error ,  measurement system
Semi thesaurus term： 画像処理アルゴリズム , 【Automatic Indexing@JST】

JST classification (1)： Electron and ion beams  (BD02030F)

Terms in the title (6)： 干渉法 ,  HLS ,  ビーム ,  横方向 ,  サイズ ,  エミッタンス