Art

J-GLOBAL ID：201602273086058059   Reference number：16A0737346

High-resolution spectral measurement of low light based on DMD and PMT

弱光条件下の高分解能スペクトルを測定【JST・京大機械翻訳】

Author (5)： Lan Ruoming (Key Laboratory of Electronics and Information Technology for Space Systems, National Space Science Center, Chinese Academy of Sciences) ,  Liu Xuefeng (Key Laboratory of Electronics and Information Technology for Space Systems, National Space Science Center, Chinese Academy of Sciences) ,  Yao Xuri (Key Laboratory of Electronics and Information Technology for Space Systems, National Space Science Center, Chinese Academy of Sciences) ,  Yu Wenkai (School of Physics, Beijing Institute of Technology) ,  Zhai Guangjie (Key Laboratory of Electronics and Information Technology for Space Systems, National Space Science Center, Chinese Academy of Sciences)
Material： Guangdianzi Jiguang
Volume： 26  Issue： 11  Page： 2175-2179  Publication year： 2015 
JST Material Number： C2685A  ISSN： 1005-0086  Document type： Article
Article type： 原著論文  Country of issue： China (CHN)  Language： CHINESE (ZH)

Abstract/Point： In this paper,in order to real...

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Thesaurus term： faint light ,  spectral band ,  *high-resolution ,  spectrometer(optical) ,  detector ,  *spectrum ,  comparative test ,  spectroscopy ,  scanning ,  photomultiplier ,  spectral decomposition ,  SN ratio
Semi thesaurus term： 光路 ,  スペクトル測定 , 【Automatic Indexing@JST】

Author keywords (4)： spectral measurement ,  low light ,  high resolution ,  scanning mode

JST classification (3)： Manufacturing technology of solid-state devices  (NC03030V) ,  Spectroscopy and spectrometers in general  (BD07041Q) ,  Graphic and image processing in general  (JE04010I)

Terms in the title (3)： 光条件 ,  高分解能 ,  スペクトル