Research field (2)：
Information networks
, Computer systems
Research keywords (5)：
FPGA
, Temperature sensor
, LSI testing
, VLSI design and test
, dependable computing
Research theme for competitive and other funds (4)：
2020 - 2022 Fault tolerant design
2019 - 2022 A digital temperature and voltage sensor that can reduce effects of degradation in VLSIs
2018 - 2022 Preventive safety for VLSIs Based on Adaptive Test during Field Operation
2017 - 2019 A digital temperature and voltage sensor with high-speed and small area
Papers (19)：
Poki Chen, Joshua Adiel Wijaya, Seiji Kajihara, Trio Adiono, Hsiang-Yu Chen, Ruei-Ting Wang, Yousuke Miyake. A 1-ps Bin Size 4.87-ps Resolution FPGA Time-to-Digital Converter Based on Phase Wrapping Sorting and Selection. IEEE Access. 2022. 10. 126429-126439
Takaaki Kato, Yousuke Miyake, Seiji Kajihara. On Correction of A Delay Value Using Ring-Oscillators for Aging Detection and Prediction. Proc. IEEE Asian Test Symposium (ATS). 2022. 60-65
Yousuke Miyake, Takaaki Kato, Seiji Kajihara. Path Delay Measurement with Correction for Temperature And Voltage Variations. Proc. IEEE International Test Conference in Asia (ITC-Asia). 2020. 112-117
Takaaki Kato, Yousuke Miyake, Seiji Kajihara. On Correction for Temperature and Voltage Effects in On-Chip Delay Measurement. 2022. 121. 388. 18-23
Masayuki Gondo, Yousuke Miyake, Takaaki Kato, Seiji Kajihara. Effectiveness of Degradation Prediction Model with Different Chip Operation. IEICE General Conference 2021. 2021. D-10-3. 80
On-Chip Delay Measurement for In-Field Test
(IEEE VLSI Test Symposium (VTS), IP session, "Innovative Test Practices in Asia" 2020)
A Correction Method for Temperature and Voltage Effects in an On-Chip Delay Measurement
(FTC Workshop 2020)
On Machine Learning Based Calibration for An On-chip Digital Thermal/voltage Sensor
(International Symposium on Applied Engineering and Sciences (SAES2019) 2019)
