Sample Preparation and Experimental Conditions for XRF and XRD : Fundamental parameter method for quantitative analysis using ED-XRF
(Th 59th Denver X-ray conference 2019)
Polarization properties of X-rays and Their Applications to X-ray Analysis
(14th International Symposium on Radiation Physics 2018)
3D-printed Spectrometers and Their Applications
(5th International conference on X-ray Analysis 2018)