Art

J-GLOBAL ID：201702230766564482   Reference number：17A0096685

Research on Preparation and Property of PZT Multilayered Thin Films with Different Structures

異なる構造の多層PZT薄膜の調製と性能特性の研究【JST・京大機械翻訳】

Author (4)： Zheng Junhua (Science and Technology on Electronic Test & Measurement Lab.,North University of China, Key Lab.of Instrumentation Science &Dynamic Measurement,North University of China,Ministry of Education) ,  Tan Qiulin (Science and Technology on Electronic Test & Measurement Lab.,North University of China, Key Lab.of Instrumentation Science &Dynamic Measurement,North University of China,Ministry of Education) ,  Tang Licheng (Science and Technology on Electronic Test & Measurement Lab.,North University of China, Key Lab.of Instrumentation Science &Dynamic Measurement,North University of China,Ministry of Education) ,  Xiong Jijun (Science and Technology on Electronic Test & Measurement Lab.,North University of China, Key Lab.of Instrumentation Science &Dynamic Measurement,North University of China,Ministry of Education)
Material： Yadian yu Shengguang  (Piezoelectrics & Acoustooptics)
Volume： 38  Issue： 4  Page： 655-658  Publication year： 2016 
JST Material Number： C2465A  ISSN： 1004-2474  CODEN： YASHE7  Document type： Article
Article type： 原著論文  Country of issue： China (CHN)  Language： CHINESE (ZH)

Abstract/Point： Two kinds of PZT(lead zirconat...

Register(free) or Log In to access     To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=17A0096685&from=J-GLOBAL&jstjournalNo=C2465A") }}

Thesaurus term： *thin film ,  residual polarization ,  sol-gel process ,  ferroelectricity ,  X-ray diffraction ,  permittivity ,  field emission ,  measurement system ,  crystal orientation ,  dielectric loss ,  scanning electron microscope ,  *multilayer ,  impedance
Semi thesaurus term： 電界放出型走査電子顕微鏡 ,  チタン酸ジルコニウム , 【Automatic Indexing@JST】

Author keywords (6)： Multilayer PT/PZT thin films ,  different structures ,  piezoelectric materials ,  Sol-Gel method ,  dielectric properties ,  ferroelectric properties

JST classification (3)： Oxide thin films  (BK14050P) ,  Inorganic compounds and elements in general  (CD01010D) ,  Bases,metal oxides  (CD01030Z)

Terms in the title (6)： 多層 ,  PZT ,  薄膜 ,  調製 ,  性能特性 ,  研究