藤本俊幸

フジモトトシユキ | Fujimoto Toshiyuki

所属機関・部署：
職名：研究戦略部長
ホームページURL (1件)： http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=T49954079

研究分野 (1件)：ナノ材料科学

論文 (69件)：

Jämting, A.K., Lin, H.-L., Fu, W.-E., Weng, H.-F., Misumi, I., Sugawara, K., Gonda, S., Takahashi, K., Takahata, K., Ehara, K., et al. Nanoparticle Characterization-Supplementary Comparison on Nanoparticle Size. Metrologia. 2019. 56. 1A
Tomohiro Narukawa, Kazumi Inagaki, Shigehiro Naito, Yanbei Zhu, Shin-ichi Miyashita, Takayoshi Kuroiwa, Akiharu Hioki, Toshiyuki Fujimoto, Koichi Chiba. Assessment of technical problems in the analysis of inorganic elements in squid through proficiency testing. TRAC-TRENDS IN ANALYTICAL CHEMISTRY. 2016. 76. 216-226
Kyung Joong Kim, An Soon Kim, Jong Shick Jang, Jung Ki Suh, Thomas Wirth, Vasile-Dan Hodoroaba, Wolfgang Unger, Joyce R. Araujo, Braulio S. Archanjo, Carlos E. Galhardo, et al. CCQM K-129 Measurement of mole fractions of Cu, In, Ga and Se in Cu(In,Ga)Se-2 Films Final Report. METROLOGIA. 2016. 53
Kim Kyung Joong, Jang Jong Shik, Kim An Soon, Suh Jung Ki, Chung Yong-Duck, Hodoroaba Vasile-Dan, Wirth Thomas, Unger Wolfgang, Kang Hee Jae, Popov Oleg, et al. CCQM pilot study CCQM-P140: quantitative surface analysis of multi-element alloy films. METROLOGIA. 2015. 52
D. Windover, D. L. Gil, Y. Azuma, T. Fujimoto. Determining sample alignment in x-ray reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials. MEASUREMENT SCIENCE AND TECHNOLOGY. 2014. 25. 10

MISC (33件)：

学位 (1件)：

所属学会 (3件)：

The Japan Society for Analytical Chemistry , The Chemical Society of Japan , Catalysis Society of Japan

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藤本 俊幸