Crystal Growth of Semiconductor SiC and Material Characterization
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論文 (609件):
Hajime Tanaka, Tsunenobu Kimoto, Nobuya Mori. Theoretical study on high-field carrier transport and impact ionization coefficients in 4H-SiC. Materials Science in Semiconductor Processing. 2024. 173. 108126-108126
Masahiro Hara, Takeaki Kitawaki, Hajime Tanaka, Mitsuaki Kaneko, Tsunenobu Kimoto. Tunneling current through non-alloyed metal/heavily-doped SiC interfaces. Materials Science in Semiconductor Processing. 2024. 171. 108023-108023
Ryoya Ishikawa, Hajime Tanaka, Mitsuaki Kaneko, Tsunenobu Kimoto. Origin of hole mobility anisotropy in 4H-SiC. Journal of Applied Physics. 2024. 135. 7
Kyota Mikami, Keita Tachiki, Mitsuaki Kaneko, Tsunenobu Kimoto. Insight Into Mobility Improvement by the Oxidation-Minimizing Process in SiC MOSFETs. IEEE Transactions on Electron Devices. 2024. 71. 1. 931-934
Mitsuaki Kaneko, Masashi Nakajima, Qimin Jin, Noriyuki Maeda, Tsunenobu Kimoto. 350°C Operation of SiC Complementary JFET Logic Gates. 2023 IEEE CPMT Symposium Japan (ICSJ). 2023
T. Kimoto, H. Niwa, T. Okuda, E. Saito, Y. Zhao, S. Asada, J. Suda. Carrier lifetime and breakdown phenomena in SiC power device material. Journal of Physics D: Applied Physics. 2018. 51. 36
Tanaka H, Suda J, Kimoto T. Insight into phonon scattering in Si nanowires through high-field hole transport: Impacts of boundary condition and comparison with bulk phonon approximation. Journal of Physics: Conference Series. 2017. 864. 1
Progress and Future Challenges of SiC Power MOSFETs
(5th IEEE Electron Devices Technology and Manufacturing Conference 2021 2021)
WISE Program: Innovation of Advanced Photonic and Electronic Devices
(International Workshop on Education and Research for Future Electronics 2021)
Lateral spreads of Al and P atoms implanted into a high-purity semi-insulating SiC substrate
(2020 International Conference on Solid State Devices and Materials 2020)
High electron mobility along the c-axis in 4H-SiC
(2020 International Conference on Solid State Devices and Materials 2020)
Accurate Determination of Barrier Heights in Heavily-Doped SiC Schottky Barrier Diodes Fabricated with Various Metals
(2020 International Conference on Solid State Devices and Materials 2020)