Katsuhiro Tsuji, Kazuo Terada. Comparison of Channel Length Extracted from Gate Capacitance with That Extracted from Channel Resistance. 2014 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS). 2014. 87-91
Comparison of Channel Length Extracted from Gate Capacitance with That Extracted from Channel Resistance
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Difference in Threshold-Voltage Variability Caused by Measurement Method
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Threshold Voltage Variation Extracted from MOSFET C-V Curves by Charge-Based Capacitance Measurement
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