文献
J-GLOBAL ID:200902044453296155
整理番号:87A0283434
層間での粗さが反射率および多層膜X線ミラーの分解能に及ぼす影響
Influence of interplane roughness on the reflectivity and resolution of multilayer X-ray mirrors.
著者 (7件):
GAPONOV S V
(Inst. Applied Physics, Academy of Sciences of the USSR, Gorki, SUN)
,
GUSEV S A
(Inst. Applied Physics, Academy of Sciences of the USSR, Gorki, SUN)
,
PLATONOV YU YA
(Inst. Applied Physics, Academy of Sciences of the USSR, Gorki, SUN)
,
POLUSHKIN N I
(Inst. Applied Physics, Academy of Sciences of the USSR, Gorki, SUN)
,
SALASHCHENKO N N
(Inst. Applied Physics, Academy of Sciences of the USSR, Gorki, SUN)
,
FOMINA N I
(Inst. Applied Physics, Academy of Sciences of the USSR, Gorki, SUN)
,
FRAERMAN A A
(Inst. Applied Physics, Academy of Sciences of the USSR, Gorki, SUN)
資料名:
Soviet Physics-Technical Physics
(Soviet Physics-Technical Physics)
巻:
31
号:
5
ページ:
541-544
発行年:
1986年05月
JST資料番号:
E0952A
ISSN:
0038-5662
CODEN:
SPTPA3
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)