文献
J-GLOBAL ID:200902204572388014
整理番号:08A0187726
積極的に縮尺した45nmバルクCMOS技術において重要な役目を果たす高性能トランジスタ
High Performance Transistors Featured in an Aggressively Scaled 45nm Bulk CMOS Technology
著者 (40件):
LUO Z.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
ROVEDO N.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
ONG S.
(Chartered Semiconductor Manufacturing)
,
PHOONG B.
(Chartered Semiconductor Manufacturing)
,
ELLER M.
(Infineon Technol. AG)
,
UTOMO H.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
RYOU C.
(Samsung Electronics Co., Ltd)
,
WANG H.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
STIERSTORFER R.
(Infineon Technol. AG)
,
CLEVENGER L.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
KIM S.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
TOOMEY J.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
SCIACCA D.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
LI J.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
WILLE W.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
ZHAO L.
(Chartered Semiconductor Manufacturing)
,
TEO L.
(Chartered Semiconductor Manufacturing)
,
DYER T.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
FANG S.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
YAN J.
(Infineon Technol. AG)
,
KWON O.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
KWON O.
(Infineon Technol. AG)
,
PARK D.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
HOLT J.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
HAN J.
(Infineon Technol. AG)
,
CHAN V.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
YUAN J.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
KEBEDE T.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
LEE H.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
KIM S.
(Infineon Technol. AG)
,
LEE S.
(Samsung Electronics Co., Ltd)
,
VAYSHENKER A.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
YANG Z.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
TIAN C.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
NG H.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
SHANG H.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
,
HIERLEMANN M.
(Infineon Technol. AG)
,
KU J.
(Samsung Electronics Co., Ltd)
,
SUDIJONO J.
(Chartered Semiconductor Manufacturing)
,
IEONG M.
(IBM Semiconductor Res. and Dev. Center (SRDC), NY)
資料名:
Digest of Technical Papers. Symposium on VLSI Technology
(Digest of Technical Papers. Symposium on VLSI Technology)
巻:
2007
ページ:
14-15
発行年:
2007年
JST資料番号:
A0035B
ISSN:
0743-1562
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)