文献
J-GLOBAL ID:200902206162148108
整理番号:08A0155209
金属-ゲルマニウム-金属光検出器(MGM-PD)へのドーパント偏析の応用とその暗電流抑制機構
Application of dopant segregation to metal-germanium-metal photodetectors and its dark current suppression mechanism
著者 (8件):
ZANG H.
(Inst. of Microelectronics, A*STAR, 11 Sci. Park Road, Singapore 117685 Singapore)
,
LEE S. J.
(Silicon Nano Devices Lab., ECE Dep., National Univ. of Singapore, Singapore 117576, SGP)
,
LOH W. Y.
(Inst. of Microelectronics, A*STAR, 11 Sci. Park Road, Singapore 117685 Singapore)
,
WANG J.
(Inst. of Microelectronics, A*STAR, 11 Sci. Park Road, Singapore 117685 Singapore)
,
YU M. B.
(Inst. of Microelectronics, A*STAR, 11 Sci. Park Road, Singapore 117685 Singapore)
,
LO G. Q.
(Inst. of Microelectronics, A*STAR, 11 Sci. Park Road, Singapore 117685 Singapore)
,
KWONG D. L.
(Inst. of Microelectronics, A*STAR, 11 Sci. Park Road, Singapore 117685 Singapore)
,
CHO B. J.
(Silicon Nano Devices Lab., ECE Dep., National Univ. of Singapore, Singapore 117576, SGP)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
92
号:
5
ページ:
051110
発行年:
2008年02月04日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)