文献
J-GLOBAL ID:200902224826189409
整理番号:07A1233072
GaInN/GaN発光ダイオードにおける効率低下に及ぼす転位密度の影響
Effect of dislocation density on efficiency droop in GaInN/GaN light-emitting diodes
著者 (10件):
SCHUBERT Martin F.
(Future Chips Constellation, Dep. of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Inst. ...)
,
CHHAJED Sameer
(Future Chips Constellation, Dep. of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Inst. ...)
,
KIM Jong Kyu
(Future Chips Constellation, Dep. of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Inst. ...)
,
SCHUBERT E. Fred
(Future Chips Constellation, Dep. of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Inst. ...)
,
KOLESKE Daniel D.
(Sandia National Laboratories, Albuquerque, New Mexico 87185, USA)
,
CRAWFORD Mary H.
(Sandia National Laboratories, Albuquerque, New Mexico 87185, USA)
,
LEE Stephen R.
(Sandia National Laboratories, Albuquerque, New Mexico 87185, USA)
,
FISCHER Arthur J.
(Sandia National Laboratories, Albuquerque, New Mexico 87185, USA)
,
THALER Gerald
(Sandia National Laboratories, Albuquerque, New Mexico 87185, USA)
,
BANAS Michael A.
(Sandia National Laboratories, Albuquerque, New Mexico 87185, USA)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
91
号:
23
ページ:
231114-231114-3
発行年:
2007年12月03日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)