文献
J-GLOBAL ID:200902228929836440
整理番号:05A0995062
ステップ高さ試料における基礎直線に関連するパラメータの信頼性:ナノメータ計測AFMを用いたステップ高さ測定における不確実性評価
Reliability of parameters of associated base straight line in step height samples: Uncertainty evaluation in step height measurements using nanometrological AFM
著者 (9件):
MISUMI Ichiko
(National Metrology Inst. of Japan, National Inst. of Advanced Industrial Sci. and Technol. (NMIJ/AIST), Tsukuba ...)
,
GONDA Satoshi
(National Metrology Inst. of Japan, National Inst. of Advanced Industrial Sci. and Technol. (NMIJ/AIST), Tsukuba ...)
,
KUROSAWA Tomizo
(National Metrology Inst. of Japan, National Inst. of Advanced Industrial Sci. and Technol. (NMIJ/AIST), Tsukuba ...)
,
AZUMA Yasushi
(National Metrology Inst. of Japan, National Inst. of Advanced Industrial Sci. and Technol. (NMIJ/AIST), Tsukuba ...)
,
FUJIMOTO Toshiyuki
(National Metrology Inst. of Japan, National Inst. of Advanced Industrial Sci. and Technol. (NMIJ/AIST), Tsukuba ...)
,
KOJIMA Isao
(National Metrology Inst. of Japan, National Inst. of Advanced Industrial Sci. and Technol. (NMIJ/AIST), Tsukuba ...)
,
SAKURAI Toshihisa
(Tohoku Univ., Aza-Aoba 10, Aramaki, Aoba-ku, Sendai 980-8579, JPN)
,
OHMI Tadahiro
(Tohoku Univ., Aza-Aoba 10, Aramaki, Aoba-ku, Sendai 980-8579, JPN)
,
TAKAMASU Kiyoshi
(The Univ. of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8654, JPN)
資料名:
Precision Engineering
(Precision Engineering)
巻:
30
号:
1
ページ:
13-22
発行年:
2006年01月
JST資料番号:
A0734B
ISSN:
0141-6359
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)