文献
J-GLOBAL ID:200902242821648489
整理番号:06A0416333
NiO薄膜における抵抗性メモリスイッチングに関するフィラメント状伝導の電気的観測
Electrical observations of filamentary conductions for the resistive memory switching in NiO films
著者 (16件):
KIM D. C.
(Samsung Advanced Inst. of Technol., Suwon 440-600, KOR)
,
SEO S.
(Samsung Advanced Inst. of Technol., Suwon 440-600, KOR)
,
AHN S. E.
(Samsung Advanced Inst. of Technol., Suwon 440-600, KOR)
,
SUH D.-s.
(Samsung Advanced Inst. of Technol., Suwon 440-600, KOR)
,
LEE M. J.
(Samsung Advanced Inst. of Technol., Suwon 440-600, KOR)
,
PARK B.-h.
(Samsung Advanced Inst. of Technol., Suwon 440-600, KOR)
,
YOO I. K.
(Samsung Advanced Inst. of Technol., Suwon 440-600, KOR)
,
BAEK I. G.
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
,
KIM H.-j.
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
,
YIM E. K.
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
,
LEE J. E.
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
,
PARK S. O.
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
,
KIM H. S.
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
,
CHUNG U-in
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
,
MOON J. T.
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
,
RYU B. I.
(Process Dev. Team, Semiconductor R & D Center, Samsung Electronics, Co. Ltd., San #24, Nongseo-Ri, Kiheung-Eup ...)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
88
号:
20
ページ:
202102-202102-3
発行年:
2006年05月15日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)