文献
J-GLOBAL ID:200902256517446501
整理番号:07A0106349
明視野像を用いた三次元電子トモグラフィーの応用 Al-Si合金中の2つのタイプのSi相
Application of three-dimensional electron tomography using bright-field imaging-Two types of Si-phases in Al-Si alloy
著者 (6件):
KANEKO Kenji
(Dep. of Material Sci. and Engineering, Kyushu Univ., 744, Motooka, Nishi, Fukuoka 819-0395, JPN)
,
NAGAYAMA Ryo
(Dep. of Material Sci. and Engineering, Kyushu Univ., 744, Motooka, Nishi, Fukuoka 819-0395, JPN)
,
INOKE Koji
(Dep. of Material Sci. and Engineering, Kyushu Univ., 744, Motooka, Nishi, Fukuoka 819-0395, JPN)
,
INOKE Koji
(FEI Co. Japan Ltd., 13-34, Kohnan 2, Minato-ku, Tokyo 108-0075, JPN)
,
NOGUCHI Etsuko
(Dep. of Material Sci. and Engineering, Kyushu Univ., 744, Motooka, Nishi, Fukuoka 819-0395, JPN)
,
HORITA Zenji
(Dep. of Material Sci. and Engineering, Kyushu Univ., 744, Motooka, Nishi, Fukuoka 819-0395, JPN)
資料名:
Science and Technology of Advanced Materials
(Science and Technology of Advanced Materials)
巻:
7
号:
7
ページ:
726-731
発行年:
2006年10月
JST資料番号:
W1262A
ISSN:
1468-6996
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)