文献
J-GLOBAL ID:200902261034069670
整理番号:09A0064097
有機薄膜トランジスタの低周波雑音の解析
Low frequency noise analysis on organic thin film transistors
著者 (9件):
KE Lin
(Inst. of Materials Res. and Engineering, 3 Res. Link, Singapore 117602, SGP)
,
DOLMANAN Surani Bin
(Inst. of Materials Res. and Engineering, 3 Res. Link, Singapore 117602, SGP)
,
SHEN Lu
(Inst. of Materials Res. and Engineering, 3 Res. Link, Singapore 117602, SGP)
,
VIJILA Chellappan
(Inst. of Materials Res. and Engineering, 3 Res. Link, Singapore 117602, SGP)
,
CHUA Soo Jin
(Inst. of Materials Res. and Engineering, 3 Res. Link, Singapore 117602, SGP)
,
PNG Rui-qi
(Dep. of Physics, National Univ. of Singapore, Lower Kent Ridge Road, Singapore 117542, SGP)
,
CHIA Perq-jon
(Dep. of Physics, National Univ. of Singapore, Lower Kent Ridge Road, Singapore 117542, SGP)
,
CHUA Lay-lay
(Dep. of Physics, National Univ. of Singapore, Lower Kent Ridge Road, Singapore 117542, SGP)
,
HO Peter K.-H.
(Dep. of Physics, National Univ. of Singapore, Lower Kent Ridge Road, Singapore 117542, SGP)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
104
号:
12
ページ:
124502
発行年:
2008年12月15日
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)