文献
J-GLOBAL ID:200902271497087690
整理番号:08A0631747
半導体製造工程に用いる液体試料中の痕跡ニッケルの,α-フリルジオキシムを用いる高感度固相比色分析によるオンサイト定量分析
On-site Determination of Trace Nickel in Liquid Samples for Semiconductor Manufacturing by Highly Sensitive Solid-phase Colorimetry with α-Furil Dioxime
著者 (5件):
MIZUGUCHI Hitoshi
(Graduate School of Sci. and Engineering, Yamagata Univ.)
,
ZHANG Yan-fan
(Graduate School of Sci. and Engineering, Yamagata Univ.)
,
ONODERA Hirofumi
(Graduate School of Sci. and Engineering, Yamagata Univ.)
,
NISHIZAWA Saori
(Graduate School of Sci. and Engineering, Yamagata Univ.)
,
SHIDA Junichi
(Graduate School of Sci. and Engineering, Yamagata Univ.)
資料名:
Chemistry Letters
(Chemistry Letters)
巻:
37
号:
7
ページ:
792-793 (J-STAGE)
発行年:
2008年
JST資料番号:
S0742A
ISSN:
0366-7022
CODEN:
CMLTAG
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
日本 (JPN)
言語:
英語 (EN)