文献
J-GLOBAL ID:200902276515177172
整理番号:07A0157958
ダイヤモンドSchottky障壁ダイオードの漏れ電流解析
Leakage current analysis of diamond Schottky barrier diode
著者 (7件):
UMEZAWA Hitoshi
(Diamond Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba Center 2, Tsukuba ...)
,
SAITO Takeyasu
(Diamond Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba Center 2, Tsukuba ...)
,
TOKUDA Norio
(Diamond Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba Center 2, Tsukuba ...)
,
OGURA Masahiko
(Diamond Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba Center 2, Tsukuba ...)
,
RI Sung-gi
(Diamond Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba Center 2, Tsukuba ...)
,
YOSHIKAWA Hiromichi
(Diamond Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba Center 2, Tsukuba ...)
,
SHIKATA Shin-ichi
(Diamond Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), Tsukuba Center 2, Tsukuba ...)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
90
号:
7
ページ:
073506-073506-3
発行年:
2007年02月12日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)